TEM Nanoparticle Analysis
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Transmission Electron Microscopy (TEM) is a technique that uses an electron beam to image a nanoparticle sample, providing much higher resolution than is possible with light-based imaging techniques. TEM is the preferred method to directly measure nanoparticle size, grain size, size distribution, and morphology.
At nanoComposix, we use a JEOL 1010 transmission electron microscope operating at an accelerating voltage of 100 keV and an AMT XR41-B 4-megapixel (2048) bottom mount CCD camera. The camera’s finite-conjugate optical coupler provides high resolution and flat focus with less than 0.1% distortion for magnifications as high as 150,000x.