SEM Nanoparticle Analysis
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Scanning Electron Microscopy (SEM) is a technique that produces images of a sample by scanning the surface with an electron beam and detecting the scattered electrons that reflect off the surface. This provides high resolution, three dimensional images of micron and nanometer sized particles for the purpose of determine surface morphology, size, and size distribution.
At nanoComposix, we use a Hitachi S-4700 scanning electron microscope with an accelerating voltage ranging from 0.1-30 kV, and current of 1-50 µA. We can routinely image metallic nanoparticle samples down to 10's of nanometers, and polymeric samples as small as 100 nm with a magnification range of 300x-100,000x.